Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry-Reference-Cited by-同舟云学术

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Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

Published:2018-09-14 Issue:19 Volume:26 Page:25408
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Gu Honggang,Chen Xiuguo^ORCID,Shi Yating,Jiang Hao^ORCID,Zhang Chuanwei,Gong Peng,Liu Shiyuan^ORCID

Funder

China Postdoctoral Science Foundation

National Natural Science Foundation of China (NSFC)

National Science and Technology Major Project of China

National Science Foundation (NSF)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference50 articles.

1. Achromatization of waveplate for broadband polarimetric system

2. Optimal broadband Mueller matrix ellipsometer using multi-waveplates with flexibly oriented axes

3. Lateral shearing interferometer with variable shearing for measurement of a small beam

4. A new quantum speed-meter interferometer: measuring speed to search for intermediate mass black holes

5. Dichroism-sensitive photoacoustic computed tomography

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