Enhanced microwave metrology using an optical grating in Rydberg atoms

Abstract

An enhanced measurement of the microwave (MW) electric (E) field is proposed using an optical grating in Rydberg atoms. Electromagnetically induced transparency (EIT) of Rydberg atoms appears driven by a probe field and a control field. The EIT transmission spectrum is modulated by an optical grating. When a MW field drives the Rydberg transition, the central principal maximum of the grating spectrum splits. It is interesting to find that the magnitude of the sharp grating spectrum changes linearly with the MW E-field strength, which can be used to measure the MW E-field. The simulation result shows that the minimum detectable E-field strength is nearly 1/8 of that without gratings, and its measurement accuracy could be enhanced by about 60 times. Other discussion of MW metrology based on a grating spectrum is also presented.