Novel approach to optical profiler with gradient focal point methods
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference11 articles.
1. High-speed measurement of three-dimensional surface profiles up to 10 μm using two-wavelength phase-shifting interferometry utilizing an injection locking technique
2. Note: High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers
3. Phase imaging without 2π ambiguity by multiwavelength digital holography
4. Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition
5. Dual-wavelength slightly off-axis digital holographic microscopy
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1. Color three-dimensional imaging based on patterned illumination using a negative pinhole array;Optics Express;2021-02-16
2. Simultaneous multisurface measurement of freeform refractive optics based on computer-aided deflectometry;Optica;2020-08-21
3. Annular-beam dual-detection confocal reflectance microscopy for high-speed three-dimensional surface profiling with an extended volume;Measurement Science and Technology;2020-01-08
4. High-speed color three-dimensional measurement based on parallel confocal detection with a focus tunable lens;Optics Express;2019-09-20
5. Multipoint scanning dual-detection confocal microscopy for fast 3D volumetric measurement;Journal of Microscopy;2017-12-18
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