Characterizing integration time and gray-level-related nonlinearities in a NMOS sensor-Reference-Cited by-同舟云学术

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Characterizing integration time and gray-level-related nonlinearities in a NMOS sensor

Published:2014-11-07 Issue:32 Volume:53 Page:7778
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Pacheco-Labrador Javier,Ferrero Alejandro,Martín M. Pilar

Publisher

The Optical Society

Reference15 articles.

1. Progress in field spectroscopy

2. SpecNet revisited: bridging flux and remote sensing communities

3. Apparent violation of the radiant exposure reciprocity law in interline CCDs

4. Si-photodiode spectral nonlinearity in the infrared

5. Photoresponse nonlinearity of solid-state image sensors with antiblooming protection

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