Waveguide Raman scattering for recovery of arbitrary thin-film concentration distributions
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Publisher
The Optical Society
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2. Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision;The Analyst;2015
3. Inverse problem theory in the optical depth profilometry of thin films;Review of Scientific Instruments;2002-12
4. Variable-angle internal-reflection Raman spectroscopy for depth-resolved vibrational characterization of polymer thin films;Physical Review B;1998-02-15
5. Precise control of evanescent fields from a Gaussian beam for depth-resolved spectroscopy;Journal of the Optical Society of America B;1997-12-01
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