Measurement of the thickness of the surface layer on amorphous Ge films using spectroscopic ellipsometry: validity of effective medium modeling
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The Optical Society
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1. Spectro-ellipsometric modeling and optimization of two-dimensional Ge layer and three-dimensional Ge dot/island structures on SiO2 substrates;Japanese Journal of Applied Physics;2021-01-01
2. Detection of medium-range-order structure in amorphous germanium films by spectroscopic ellipsometry;Journal of Applied Crystallography;2015-06-16
3. Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach;Acta Physica Sinica;2010
4. Nanocrystalline formation and optical properties of germanium thin films prepared by physical vapor deposition;Journal of Physics and Chemistry of Solids;2009-10
5. Optical and structural characterisation of single and multilayer germanium/silicon monoxide systems;Thin Solid Films;2005-08
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