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Microsphere-assisted phase-shifting profilometry

  • Published:2017-08-30 Issue:25 Volume:56 Page:7249
  • ISSN:1559-128X
  • Container-title:Applied Optics
  • language:en
  • Short-container-title:Appl. Opt.

Author:

Perrin Stephane,Leong-Hoï Audrey,Lecler Sylvain,Pfeiffer Pierre,Kassamakov Ivan,Nolvi Anton,Hæggström Edward,Montgomery Paul

Funder

Université de Strasbourg

SATT Conectus Alsace

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Cited by 35 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical Microsphere Nano-Imaging: Progress and Challenges;Engineering;2024-05

2. Design and fabrication of universal resolution targets for microsphere-assisted microscopy;Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI;2024-03-12

3. Microsphere-assisted quantitative phase microscopy: a review;Light: Advanced Manufacturing;2024

4. Microsphere-assisted microscopy: challenges and opportunities;Optical Measurement Systems for Industrial Inspection XIII;2023-08-15

5. Microsphere probe: combining microsphere-assisted microscopy with AFM;Optics Express;2023-08-02
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