Measuring optical constants of ultrathin layers using surface-plasmon-resonance-based imaging ellipsometry-Reference-Cited by-同舟云学术

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Measuring optical constants of ultrathin layers using surface-plasmon-resonance-based imaging ellipsometry

Published:2017-09-27 Issue:28 Volume:56 Page:7898
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Shan Yao,Hu Guohang,Gu Liyuan,He Hongbo,Zeng Aijun,Zhao Yuanan,Sytchkova Anna

Funder

National Natural Science Foundation of China (NSFC)

National Key Research and Development Project of China

Italian-Chinese Project of Great Relevance

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference26 articles.

1. Plasmonics: visit the past to know the future

2. Optical Constants of the Noble Metals

3. Optical constants of evaporated gold films measured by surface plasmon resonance at telecommunication wavelengths

4. Visualization of the complex refractive index of a conductor by frustrated total internal reflection

5. Interference-aided spectrum-fitting method for accurate film thickness determination

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