High-resolution ab initio three-dimensional x-ray diffraction microscopy-Reference-Cited by-同舟云学术

High-resolution ab initio three-dimensional x-ray diffraction microscopy

Published:2006-05-01 Issue:5 Volume:23 Page:1179
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Chapman Henry N.,Barty Anton,Marchesini Stefano,Noy Aleksandr,Hau-Riege Stefan P.,Cui Congwu,Howells Malcolm R.,Rosen Rachel,He Haifeng,Spence John C. H.,Weierstall Uwe,Beetz Tobias,Jacobsen Chris,Shapiro David

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference44 articles.

1. X-ray microscopy

2. On the Extendibility of X-ray Crystallography to Noncrystals

3. Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens

4. Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction

5. Three-Dimensional Imaging of Microstructure in Au Nanocrystals

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