Pseudoscopic imaging in a double diffraction process with a slit: critical point properties
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Optical shifter for a three-dimensional image by use of a gradient-index lens array
2. Pseudoscopic imaging in a double diffraction process with a slit
3. Eyeglass 1 Very large aperture diffractive telescopes
4. Diffraction grating and optical aberrations: a new and exact formulation
5. Alignment and/or tilting measurement by means of conical diffraction phenomena
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