Substrate parameter determination for thin film spectrophotometric measurement correction
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Published:1983-04-15
Issue:8
Volume:22
Page:1247
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ISSN:0003-6935
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Container-title:Applied Optics
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language:en
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Short-container-title:Appl. Opt.
Author:
Matzeu M.,Panatta A.
Publisher
The Optical Society