An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2 Interpretation and application to focusing experiments
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference6 articles.
1. An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes
2. Reflective optics for sub-10nm hard X-ray focusing
3. Surface Studies of Solids by Total Reflection of X-Rays
4. Graded multilayers for focusing hard x-rays below 50 nm
5. Parallel-beam coupling into channel-cut monochromators using curved graded multilayers
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