Polarized spectral emittance from periodic micromachined surfaces: V Undoped silicon: angular measurement in shallow lamellar gratings
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Publisher
The Optical Society
Reference19 articles.
1. Polarized spectral emittance from periodic micromachined surfaces—III. Undoped silicon: The normal direction in shallow lamellar gratings
2. Polarized spectral emittance from periodic micromachined surfaces: IV Undoped silicon: Normal direction in deep lamellar gratings
3. Optical elements with ultrahigh spatial-frequency surface corrugations
4. Submicrometer periodicity gratings as artificial anisotropic dielectrics
5. Strong localization of photons in certain disordered dielectric superlattices
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