Transmission and reflection ellipsometry of thin films and multilayer systems
Author:
Publisher
The Optical Society
Reference8 articles.
1. Lithiation studies on some transition metal oxides for an all-solid thin film electrochromic system
2. Reflection–transmission photoellipsometry: theory and experiments
3. Structure and infrared spectra of sol—gel derived tungsten oxide thin films
4. Quasi-symmetric electrochromic device for light modulation
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