Analysis of errors in thin-film optical parameters derived from spectrophotometric measurements at normal light incidence
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Publisher
The Optical Society
Reference10 articles.
1. Determination of thin film optical parameters from photometric measurements: an algebraic solution for the (T,R_f,R_b) method
2. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,Rm) technique
3. Determination of optical properties of absorbing materials: a generalized scheme
4. Method for the determination of optical constants of thin films: dependence on experimental uncertainties
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