Variations in stoichiometry in Hg_1−xCdxTe using electrolyte electroreflectance: a topographical investigation
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Publisher
The Optical Society
Reference2 articles.
1. Electroreflectance at a Semiconductor-Electrolyte Interface
2. Electroreflectance Study of CdxHg1-xTe
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical Properties of MCT;Mercury Cadmium Telluride;2010-09-04
2. Electroreflectance at the semiconductor/electrolyte interface. A comparison of theory and experiment for n-GaAs;Berichte der Bunsengesellschaft für physikalische Chemie;1987-04
3. Microcomputer‐controlled measurement of the electrolyte electroreflectance of Ga1‐xAlxAs;Journal of the Chinese Institute of Engineers;1986-01
4. Study of mercury cadmium telluride (MCT) surfaces by automatic spectroscopic ellipsometry (ASE) and by electrolyte electroreflectance (EER);Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1985-01
5. The properties and applications of the Hg1−xCdxTe alloy system;Springer Tracts in Modern Physics;1983
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