Determinations of third- and fifth-order nonlinearities by the use of the top-hat-beam Z scan: theory and experiment
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics
Reference18 articles.
1. High-sensitivity, single-beam n_2 measurements
2. Sensitive measurement of optical nonlinearities using a single beam
3. Eclipsing Z-scan measurement of λ/10^4 wave-front distortion
4. Analysis of the EZ Scan Measurement Technique
5. Two-color near-field eclipsing Z-scan technique for the determination of nonlinear refraction
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4. Analytic solutions to closed and eclipsing aperture Z-scan power transmission;Journal of the Optical Society of America B;2022-03-16
5. Femtosecond-pulsed Z-scan study on third- and fifth-order refractive nonlinearities in a side-chain azobenzene copolymer film;Journal of Nonlinear Optical Physics & Materials;2018-03
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