Fringe pattern demodulation using the fan two-dimensional continuous wavelet transform conjugate to Shannon entropy

Author:

Elfagrich Mahfoud1ORCID

Affiliation:

1. Qualifying High School Koutoubia, MNE

Abstract

This paper proposes an algorithm for phase demodulating fringe patterns using a two-dimensional continuous wavelet transform (2D-CWT). This algorithm exploits the isotropy property of the fan mother wavelet conjugated to Shannon entropy to perform the ridge extraction process by using only 2D-CWT arguments. The proposed algorithm’s performance is shown through simulated fringe patterns corrupted by speckle noise. Also, to evaluate the accuracy of the ridge extracted from the modulus to that obtained from the arguments of 2D-CWT, the developed algorithm is compared to the maximum ridge extraction algorithm for 2D-CWT and cost function ridge extraction algorithm for 2D-CWT, which extract the ridge from the 2D-CWT modulus. Furthermore, we demonstrate the ability of the proposed algorithm to demodulate real fringe patterns derived from optical metrology for temperature measurement. The most important result of the proposed method is that it is provably optimal in estimating the 2D-CWT ridge of oriented fringes. The added strength of the algorithm is that it is simpler and has better resistance to speckle noise than previous methods because it employs scalograms of arguments, which are the origin of the definition of the ridge.

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3