Imaging Mueller matrix ellipsometry with sub-micron resolution based on back focal plane scanning-Reference-Cited by-同舟云学术

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Imaging Mueller matrix ellipsometry with sub-micron resolution based on back focal plane scanning

Published:2021-09-24 Issue:20 Volume:29 Page:32712
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Chen Chao,Chen Xiuguo^ORCID,Wang Cai,Sheng Sheng,Song Lixuan,Gu Honggang^ORCID,Liu Shiyuan^ORCID

Funder

National Natural Science Foundation of China

National Major Science and Technology Projects of China

Key Research and Development Plan of Hubei Province

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference33 articles.

1. Dimensional Micro and Nano Metrology

2. Raman Spectrum of Graphene and Graphene Layers

3. Small Angle X-ray Scattering for Nanoparticle Research

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