Spatial variant gloss measurement of dielectric materials based on a polarized camera

Author:

Lu Tsung-Lin1,Lin Tzung-HanORCID

Affiliation:

1. National Taiwan University of Science and Technology

Abstract

This study proposes an imaging method for gloss measurement solely by a single shot from a polarized camera. The system, comprising a polarized camera and well-diffused LED plate light, is inspired by the framework of ASTM D523, and it acquires images at 60° incident direction. The polarization characteristics of dielectric material samples were analyzed. A regression model was developed by using natural color system gloss scale and a commercial gloss meter. Subsequently, the gloss and spatial resolutions of this method were verified using various types of measurement samples. From experiments regarding different benchmarks, we concluded that the proposed method performs sufficiently for spatial variant gloss measurement.

Funder

National Science and Technology Council

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

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