Problem of polarization degree in spectroscopic photometric ellipsometry (polarimetry)
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Spectroscopic ellipsometry in the infrared
2. Fourier transform infrared ellipsometry of thin polymer films
3. Improvement in accuracy of spectroscopic IR ellipsometry by the use of IR retarders
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