Simultaneous three-dimensional deformation measurement using tri-wavelength and monochrome camera imaging with a pyramid prism

Author:

Yang Boshuo1,Wu Minyang,Ma YinhangORCID,Jiang Hanyang2ORCID,Yang Fujun

Affiliation:

1. National University of Singapore

2. Zhejiang University of Technology

Abstract

What we believe to be a new electronic speckle pattern interferometry (ESPI) configuration is being developed for simultaneous three-dimensional deformation measurements. In this ESPI system, two pairs of symmetrical illuminating arrangement with dual-wavelength lights were used to independently sense two in-plane deformation components, one Michelson interferometer-based set illuminating with the other wavelength light was utilized to measure out-of-plane deformation. The color speckle interferogram was split into four sub-patterns by a prism, three of them were filtered by three different bandpass dichroic filters and recorded by one monochrome camera. Micro-rotation testing work firstly verifies the validation of the proposed phase-shifting device. Three-dimensional deformation information was simultaneous obtained by using temporal phase-shift method. All strain components related to the specimen surface deformation were further determined by numerical differential. The experimental results of a tested specimen were excellently consistent with those of FEM simulation, which verified the validation and feasibility of the proposed ESPI system for measuring 3D deformation.

Funder

National Natural Science Foundation of China

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics

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