Research and application of the wavelet high-frequency coefficient direct mapping algorithm in the micro-defect target detection system of an infrared objective lens

Abstract

Various lens detection techniques for military sighting telescopes have been the focus of military production. However, most of the micro-defect detection of lenses is detected manually, which cannot guarantee the measurement precision and quality. In order to solve these problems, the wavelet high-frequency coefficients direct mapping algorithm is applied to the automatic detection system of a micro-defect target in an infrared objective lens, thus obtaining a new method of detection. The detection method utilizes the correlation feature between wavelet coefficient scales to process the acquired images to suppress the background signals. Then the noise is further filtered by the pipelined filtering method to finally realize the detection of micro-targets. The experimental results show that a relatively high signal-to-noise ratio can be obtained, and the method can detect the small and dim target whose signal-to-noise ratio is more than 2.5 times. The measurement range is ≥3pixels and the error precision is 4±1 pixels.