Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry-Reference-Cited by-同舟云学术

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Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry

Published:2009-10-21 Issue:31 Volume:48 Page:5906
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Adamson Peep

Publisher

The Optical Society

Reference22 articles.

1. High dielectric constant gate oxides for metal oxide Si transistors

2. First-principles investigation of high-κdielectrics: Comparison between the silicates and oxides of hafnium and zirconium

3. In situ ellipsometric study of optical properties of ultrathin films

4. Measurement of the principal refractive indices of thin films deposited at oblique incidence

5. Anisotropy in thin films: modeling and measurement of guided and nonguided optical properties: application to TiO_2 films

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ellipsometry of anisotropic (sub)nanometric dielectric films on absorbing materials;Journal of Modern Optics;2014-02-26

2. Correlation-free reflection diagnostics of biaxially anisotropic nanoscale films on transparent isotropic materials;Journal of Modern Optics;2011-10-20

3. Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials;Applied Optics;2011-06-09

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