Position, orientation, and relative quantum yield ratio determination of fluorescent nanoemitters via combined laser scanning microscopy and polarization measurements-Reference-Cited by-同舟云学术

Position, orientation, and relative quantum yield ratio determination of fluorescent nanoemitters via combined laser scanning microscopy and polarization measurements

Published:2018-04-23 Issue:5 Volume:8 Page:1290
ISSN:2159-3930
Container-title:Optical Materials Express
language:en
Short-container-title:Opt. Mater. Express

Author:

Dasallas Lean L.^ORCID,Jaculbia Rafael B.,Balois Maria Vanessa,Garcia Wilson O.,Hayazawa Norihiko

Publisher

The Optical Society

Subject

Electronic, Optical and Magnetic Materials

Reference34 articles.

1. Three-dimensional orientation measurements of symmetric single chromophores using polarization microscopy

2. Excitation Isotropy of Single CdSe/ZnS Nanocrystals

3. Emission properties of single CdSe/ZnS quantum dots close to a dielectric interface

4. Image Analysis of Defocused Single-Molecule Images for Three-Dimensional Molecule Orientation Studies

5. Defocused imaging of quantum-dot angular distribution of radiation

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