Validity of Ellipsometry for Determining the Average Thickness of Thin, Discontinuous, Absorbing Films*
Author:
Publisher
The Optical Society
Subject
General Engineering
Reference21 articles.
1. Multiple-Beam Fringes of Equal Chromatic Order Part III The Cleavage of Topaz
2. An optical examination of thin films. II.—The behaviour of thin films of fatty acids on mercury
3. Ellipsometry for Measurements at and below Monolayer Coverage
4. A Comparative Study of Adsorption by Ellipsometric and Radiotracer Methods
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