Affiliation:
1. Chinese Academy of Sciences
2. Jilin University
3. Jilin Provincial Key Laboratory of Advanced Optoelectronic Equipment and Instrument Manufacturing Technology
Abstract
Transparent absorbers, with a functional integration of broadband electromagnetic shielding, microwave camouflage, and optical transparency, have attracted increasing attention in the past decades. Metal mesh, an artificial, optically transparent, conducting material composed of periodic metallic gratings, is the optimal choice for the microwave shielding layer of transparent absorbers because of its excellent compatibility between high transparency and low resistance. However, the micrometer-level periodicity of metallic grating concentrates the diffraction of light, which degrades the imaging quality of cameras and sensors in common. In this study, we report on a generalized Thiessen-polygon-randomization method that prevents the concentration of the diffraction of light in periodic metallic grating and demonstrate an ultrawide-band optically transparent diffraction-immune metamaterial absorber. The absorber is constructed with a multilayer indium-tin-oxide-based metasurface and a Thiessen-polygon-randomized metal-mesh reflector. The lossy metasurface provides multimode absorption, whereas the Thiessen-polygon randomization prevents the concentration of the diffraction of light. The practical sample achieves a 10 dB absorptivity and shielding effectiveness over a range of 8–26.5 GHz, and the optical transparency is also preserved over the entire visible and near-infrared regions. The point spread function and field of view are both improved by using the antidiffraction absorber. Our study paves the way for the application of optically transparent electromagnetic devices, display, and optoelectronic integration in a more practical stage.
Funder
National Natural Science Foundation of China
Fundamental Research Funds for the Central Universities
Natural Science Foundation of Jilin Province
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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