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Influence of interface roughness on surface and bulk scattering

  • Published:2010-05-12 Issue:6 Volume:27 Page:1265
  • ISSN:1084-7529
  • Container-title:Journal of the Optical Society of America A
  • language:en
  • Short-container-title:J. Opt. Soc. Am. A

Author:

Elias Mady,Castiglione Patrizia,Elias Georges

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Preparing the generalized Harvey–Shack rough surface scattering method for use with the discrete ordinates method;Journal of the Optical Society of America A;2015-01-08

2. Superhydrophobicity and Optical Transparency in Thin Films: Criteria for Coexistence;The Journal of Physical Chemistry C;2014-03-04

3. Enhancing the chroma of pigmented polymers using antireflective surface structures;Applied Optics;2013-11-08

4. Atom probe tomography of AlInN/GaN HEMT structures;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2013-07

5. Separation of surface and bulk reflectance by absorption of bulk scattered light;Applied Optics;2013-06-28
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