Author:
McArdle Patrick,Yung Christopher,Tomlin Nathan,Lehman John,Stephens Michelle
Abstract
We have developed a low-cost micro-diffuse reflectance infrared Fourier transform spectroscopic (micro-DRIFTS) setup for measuring the reflectance of small area diffuse samples. The system performance is characterized and then demonstrated on small area vertically aligned carbon nanotube (VACNT) samples. We find that our system can measure samples with a spatial resolution of approximately 140 µm with sensitivities of 10s of ppm in the 2 µm – 18 µm spectral window. Our uncertainty budget is presented along with how our measured reflectance can be equated to directional-hemispherical reflectance.
Funder
National Institute of Standards and Technology
Subject
Atomic and Molecular Physics, and Optics
Cited by
1 articles.
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