Abstract
Intensity saturation tends to induce severe errors in high dynamic range three-dimensional measurements using structured-light techniques. This paper presents an enhanced Fourier-Hilbert-transform (EFHT) method to suppress the saturation-induced phase error in phase-shifting profilometry, by considering three types of residual errors: nonuniform-reflectivity error, phase-shift error, and fringe-edge error. Background normalization is first applied to the saturated fringe patterns to suppress the effect of the nonuniform reflectivity. A self-correction method is proposed to correct the large phase-shift error in the compensated phase. The self-corrected phase error is detected to assist in locating the fringe-edge area, within which the true phase is computed based on the sub-period phase error model. Experimental results demonstrated the effectiveness of the proposed method in suppressing the saturation-induced phase error and other three types of residual errors with fewer images.
Funder
National Natural Science Foundation of China
Central Universities
Subject
Atomic and Molecular Physics, and Optics
Cited by
2 articles.
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