Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry-Reference-Cited by-同舟云学术

Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry

Published:2016-10-10 Issue:29 Volume:55 Page:8368
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Jaiswal Jyoti,Mourya Satyendra,Malik Gaurav,Chauhan Samta,Sanger Amit,Daipuriya Ritu,Singh Manpreet,Chandra Ramesh

Funder

Ministry of Human Resource Development (MHRD)

Defence Research and Development Organisation (DRDO)

Publisher

The Optical Society

Reference41 articles.

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3. Young's modulus, fracture strain, and tensile strength of sputtered titanium thin films

4. Buckling-delamination and cracking of thin titanium films under compression: Experimental and numerical studies

5. The Structural and Mechanical Properties of Ti Films Fabricated by Using RF Magnetron Sputtering

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