Monitoring sulfur loss in polycrystalline solid solutions of CaS-La2S3 by Raman spectroscopy and X-ray diffraction

Author:

Havel Matthew,Kostogiannes Alexandros,Shoulders W. Taylor1,Blair Victoria1,McGill Daniel2,Rivero-Baleine Clara2,Bunijevac Rade3,Eichler Jeffery4,Kincer Matthew R.4,Kang Myungkoo,Richardson Kathleen A.ORCID,Gaume Romain

Affiliation:

1. DEVCOM Army Research Laboratory

2. Lockheed Martin

3. LORAD Chemical Corporation

4. Naval Surface Warfare Center - Panama City Division

Abstract

Controlling stoichiometry in materials is a critical consideration in advanced applications. Non-stoichiometry due to sulfur excess or sulfur loss is observed in the CaS-La2S3 (CLS) solid solution, a promising optical and thermoelectric material. We show that Raman spectroscopy can be used to assess deviation from stoichiometry in polycrystalline CLS. Use of this technique shows an increase in the full width at half maximum (FWHM) of the A1 vibrational peak, associated with disorder on the sulfur sublattice. This method is validated using X-ray diffraction, where a decrease in the lattice parameter is observed on either side of the stoichiometric composition. This paper illustrates the usefulness of Raman spectroscopy as a complementary metrology technique to assess stoichiometry in sulfide-based polycrystalline ceramics.

Funder

Florida High Tech Corridor Council

Publisher

Optica Publishing Group

Subject

Electronic, Optical and Magnetic Materials

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