Fast digital refocusing Fourier ptychographic microscopy method based on convolutional neural network

Abstract

Fourier ptychographic microscopy (FPM) is used to achieve high resolution and a large field of view. However, traditional FPM image reconstruction methods often yield poor image quality when encountering out-of-focus issues during reconstruction. Therefore, this study proposes a defocus-distance regression network based on convolutional neural networks. In an experimental validation, the root-mean-square error calculated from 1000 sets of predicted and true values was approximately 6.2 µm. The experimental results suggest that the proposed method has good generalization, maintains high accuracy in predicting defocus distances even for different biological samples, and extends the imaging depth-of-field of the FPM system by a factor of more than 3.