Ion beam lithography for Fresnel zone plates in X-ray microscopy-Reference-Cited by-同舟云学术

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Ion beam lithography for Fresnel zone plates in X-ray microscopy

Published:2013-05-07 Issue:10 Volume:21 Page:11747
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Keskinbora Kahraman,Grévent Corinne,Bechtel Michael,Weigand Markus,Goering Eberhard,Nadzeyka Achim,Peto Lloyd,Rehbein Stefan,Schneider Gerd,Follath Rolf,Vila-Comamala Joan,Yan Hanfei,Schütz Gisela

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference37 articles.

1. Nanoscale X-ray imaging

2. New directions in X-ray microscopy

3. Transmission and emission x-ray microscopy: operation modes, contrast mechanisms and applications

4. What Shall We Do With the X-ray Laser?

Cited by 37 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 高次谐波与阿秒脉冲在成像中的应用与前景（特邀）;Acta Optica Sinica;2024

2. Fabrication of multilayer Fresnel zone plate for hard X-ray microscopy by atomic layer deposition and focused ion beam milling;Vacuum;2023-03

3. Phase-Type Fresnel Zone Plate with Multi-Wavelength Imaging Embedded in Fluoroaluminate Glass Fabricated via Ultraviolet Femtosecond Laser Lithography;Micromachines;2021-11-04

4. Generation of super-resolved optical needle and multifocal array using graphene oxide metalenses;Opto-Electronic Advances;2021

5. X-Ray Magnetic Circular Dichroism and X-Ray Microscopy;Magnetic Measurement Techniques for Materials Characterization;2021

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