Light Source and Filters for Use in the 130–280-Å Region
Author:
Publisher
The Optical Society
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1. Characterization of a compact multilayer mirror (MLM) polarimeter for measurements of the degree of linear polarization in the 256-A to 584-A wavelength EUV range;SPIE Proceedings;1999-11-25
2. Polarization study of the extreme-ultraviolet emission from helium following electron impact;Physical Review A;1999-08-01
3. Optical characterization of a compact multilayer-mirror polarimeter in the extreme-ultraviolet range;Applied Optics;1999-07-01
4. Extreme-ultraviolet spectrum of Ne III;Journal of the Optical Society of America B;1997-03-01
5. Characteristics of a multilayer mirror polarimeter for measurements at extreme ultraviolet wavelengths;Review of Scientific Instruments;1997-01
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