High-accuracy optical vector network analyzer for optical notch and bandpass responses

Abstract

A high-accuracy optical vector network analyzer (OVNA) based on optical carrier-suppressed double sideband (CS-DSB) modulation is proposed and experimentally demonstrated. The ±1st-order sideband signals are generated by CS-DSB modulation and then pass through the symmetric optical device under test (DUT). The band-stop or band-pass responses can be realized by detecting and processing the double frequency of the driven RF signal. Compared with the conventional symmetrical DSB-based OVNA, the measurement accuracy is improved by eliminating the errors caused by the even-order sidebands, and the complexity is reduced as the proposed method with only one step measurement can avoid the complex postprocessing. In addition, the optical carrier is aligned to the center frequency of the DUT by employing the Pound–Drever–Hall (PDH) technique, which provides stable measurement. At the same time, the limitation that the band-pass responses cannot be measured by the traditional single-sideband (SSB)-based OVNA is overcome. Additionally, accurate magnitude and phase responses of the DUT near the optical carrier can be also achieved since the proposed OVNA is optical filter-immune. The proposed method is theoretically analyzed and verified by experiment. A Fabry–Perot (FP) interferometer serves as the symmetric DUT; the band-stop responses in a frequency range of 6 GHz are obtained with a resolution of 1.2 MHz; and the band-pass responses with the range from 0 to 13 GHz offsetting the optical carrier are also obtained. The measurement time can reach up to 30 min with high stability. The proposed OVNA offers enhanced accuracy and a stable approach for applications in photonic systems and other innovations.