High-resolution few-pattern method for 3D optical measurement-Reference-Cited by-同舟云学术

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High-resolution few-pattern method for 3D optical measurement

Published:2019-07-15 Issue:14 Volume:44 Page:3602
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Wu Gaoxu,Wu Yanxue,Li Lingchi,Liu Fei

Funder

National Natural Science Foundation of China (NSFC)

The Nation Key Research and Development Program

The Chongqing Research Program of Basic Research and Frontier Technology

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference29 articles.

1. Rail Profile Measurement Based on Line-structured Light Vision

2. Review and Comparison of High-Dynamic Range Three-Dimensional Shape Measurement Techniques

3. High-speed three-dimensional measurement technique for object surface with a large range of reflectivity variations

4. Contouring Aspheric Surfaces Using Two-wavelength Phase-shifting Interferometry

5. Two-wavelength lateral shearing interferometry

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