Structure-dependent amplification for denoising and background correction in Fourier ptychographic microscopy
Author:
Funder
Engineering and Physical Sciences Research Council
Wellcome Trust
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference23 articles.
1. Wide-field, high-resolution Fourier ptychographic microscopy
2. Diffraction tomography with Fourier ptychography
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