Ellipsometer Study of Anomalous Absorption in Very Thin Dielectric Films on Evaporated Metals*
Author:
Publisher
The Optical Society
Subject
General Engineering
Reference12 articles.
1. Infrared Spectra of Monolayers on Metal Mirrors
2. Some Observations on the Use of Elliptically Polarized Light to Study Metal Surfaces*
3. Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry
4. Electrical Conduction in Very Thin Polybutadiene Films Formed in a Glow Discharge
5. The Optical Constants of Silver, Gold, Copper, and Aluminum I The Absorption Coefficient k
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