Diffuse photon remission associated with the center-illuminated-area-detection geometry: Part I, an approach to the steady-state model

Author:

Sun Tengfei1,Piao DaqingORCID

Affiliation:

1. Duke University

Abstract

Diffuse photon remission associated with the center-illuminated-area-detection (CIAD) geometry has been useful for non-contact sensing and may inform single-fiber reflectance (SfR). This series of work advances model approaches that help enrich the understanding and applicability of the photon remission by CIAD. The general approach is to derive the diffuse photon remission by the area integration of the radially resolved diffuse reflectance while limiting the analysis to a medium exhibiting only the Heyney–Greenstein (HG) scattering phase function. Part I assesses the steady-state photon remission in CIAD over a reduced scattering scaled diameter of μ s d a r e a [ 0.5 × 10 3 , 10 3 ] that covers the range extensively modeled for SfR. The corresponding radially resolved diffuse reflectance is obtained by concatenating an empirical expression for the semi-ballistic region near the point-of-illumination and a formula utilizing a master-slave dual-source scheme over the semi-diffusive to a diffusive regime while being constrained by an extrapolated zero-boundary condition. The terminal algebraic photon remission is examined against Monte Carlo simulations for an absorption coefficient over [ 0.001 , 1 ] m m 1 , a reduced scattering coefficient over [ 0.01 , 1000 ] m m 1 , a HG scattering anisotropy factor within [ 0.5 , 0.95 ] , and a diameter of the area of collection ranging [ 50 , 1000 ] µ m . The algebraic model is also applied to phantom data acquired over a 2 c m non-contact CIAD configuration and with a 200 µm SfR probe. The model approach will be extended in a subsequent work towards the time-of-flight characteristics of CIAD.

Funder

U.S. Department of Agriculture

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

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