In situ and air index measurements: influence of the deposition parameters on the shift of TiO_2/SiO_2 Fabry-Perot filters-Reference-Cited by-同舟云学术

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In situ and air index measurements: influence of the deposition parameters on the shift of TiO_2/SiO_2 Fabry-Perot filters

Published:1986-11-01 Issue:21 Volume:25 Page:3909
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Schmitt B.,Borgogno J. P.,Albrand G.,Pelletier E.

Publisher

The Optical Society

Reference10 articles.

1. Optical thin film monitoring—Recent advances and limitations

2. Refractive index and inhomogeneity of thin films

3. Refractive indices of TiO_2 films produced by reactive evaporation of various titanium–oxygen phases

4. Moisture penetration patterns in thin films

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1. Wide-angle spectral imaging using a Fabry-P\'erot interferometer;Journal of the European Optical Society: Rapid Publications;2015-07-12

2. Temperature Coefficients of Refractive Indices of TiO2–SiO2Films;Japanese Journal of Applied Physics;2005-02-08

3. Optical properties of nanostructured thin films;Progress in Quantum Electronics;2004

4. Properties and Characterization of Dielectric Thin Films;Schott Series on Glass and Glass Ceramics;2003

5. Methods for Determining Optical Parameters of Thin Films;Handbook of Optical Constants of Solids;1998

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