Determination of complex refractive index and thickness of a homogeneous layer by combined reflection and transmission ellipsometry-Reference-Cited by-同舟云学术

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Determination of complex refractive index and thickness of a homogeneous layer by combined reflection and transmission ellipsometry

Published:1994-07-01 Issue:7 Volume:11 Page:2156
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Lekner John

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference3 articles.

1. Reflection and transmission ellipsometry of a uniform layer

2. Ellipsometry of a thin film between similar media

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