Author:
Shabairou Nadav,Zalevsky Zeev,Sinvani Moshe
Abstract
In this work, we demonstrate the focusing of a Gaussian laser beam, in silicon, by a vortex-shaped beam where both beams are at a wavelength of 775nm, which can sharpen the beam's PSF to improve the resolution in laser scanning microscopy.
Cited by
1 articles.
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