Transverse mode discrimination in long-wavelength wafer-fused vertical-cavity surface-emitting lasers by intra-cavity patterning-Reference-Cited by-同舟云学术

Transverse mode discrimination in long-wavelength wafer-fused vertical-cavity surface-emitting lasers by intra-cavity patterning

Published:2013-10-31 Issue:22 Volume:21 Page:26983
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Volet Nicolas,Czyszanowski Tomasz,Walczak Jaroslaw,Mutter Lukas,Dwir Benjamin,Micković Zlatko,Gallo Pascal,Caliman Andrei,Sirbu Alexei,Mereuta Alexandru,Iakovlev Vladimir,Kapon Eli

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference13 articles.

1. Power-efficient answer

2. Cavity Mode—Gain Peak Tradeoff for 1320-nm Wafer-Fused VCSELs With 3-mW Single-Mode Emission Power and 10-Gb/s Modulation Speed Up to 70 $^{\circ}$C

3. Record Single-Mode, High-Power VCSELs by Inhibition of Spatial Hole Burning

4. Reliability of 1310 nm Wafer Fused VCSELs

5. Wafer-fused heterostructures: application to vertical cavity surface-emitting lasers emitting in the 1310 nm band

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3. Polarization mode control of long-wavelength VCSELs by intracavity patterning;Optics Express;2016-04-26

4. Electrically Pumped Vertical-External-Cavity Surface-Emitting Lasers With Patterned Tunnel Junction for Single Transversal-Mode Emission;IEEE Journal of Selected Topics in Quantum Electronics;2015-11

5. Increasing single mode power of 13-μm VCSELs by output coupling optimization;Optics Express;2015-04-20