Affiliation:
1. Southern University of Science and Technology
2. National University of Singapore
Abstract
Accurate determination of scan positions is essential for achieving high-quality reconstructions in ptychographic imaging. This study presents and demonstrates a method for determining the rotation angle of the scan pattern relative to the detector pixel array using diffraction data. The method is based on the Fourier–Mellin transform and cross-correlation calculation. It can correct rotation errors up to 60 deg. High-quality reconstructions were obtained for visible light and electron microscopy datasets, and intricate structures of samples can be revealed. We believe that this refinement method for rotary position errors can be valuable for improving the performance of ptychographic four-dimensional scanning transmission electron microscopy.
Funder
National Natural Science Foundation of China
Shenzhen Science and Technology Program
Centers for Mechanical Engineering Research and Education at MIT and SUSTech
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering