Self-consistent optical constants of SiC thin films-Reference-Cited by-同舟云学术

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Self-consistent optical constants of SiC thin films

Published:2011-10-26 Issue:11 Volume:28 Page:2340
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Larruquert Juan I.,Pérez-Marín Antonio P.,García-Cortés Sergio,Rodríguez-de Marcos Luis,Aznárez José A.,Méndez José A.

Funder

Ministerio de Ciencia y Tecnología

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. Silicon-carbide diffraction grating for the vacuum ultraviolet: feasibility

2. Reflectance of silicon carbide in the vacuum ultraviolet

3. Normal incidence reflectance of ion beam deposited SiC films in the EUV

4. Amorphous silicon carbide coatings for extreme ultraviolet optics

5. Multilayer coatings with high reflectance in the extreme-ultraviolet spectral range of 50 to 1216 nm

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