Mapping materials properties with Raman spectroscopy utilizing a 2-D detector
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Publisher
The Optical Society
Reference21 articles.
1. Raman measurements of stress in silicon‐on‐sapphire device structures
2. Measurement of local stress in laser‐recrystallized lateral epitaxial silicon films over silicon dioxide using Raman scattering
3. Raman microprobe study of silicon- and germanium- on-insulator structures
4. Measurement of the Crystallographically Transformed Zone Produced by Fracture in Ceramics Containing Tetragonal Zirconia
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