In-Plane rotation analysis by two-wavelength electronic speckle interferometry
Author:
Publisher
The Optical Society
Reference4 articles.
1. Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements
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4. Temporal electronic speckle pattern interferometry for real-time in-plane rotation analysis;Optics Express;2018-03-26
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