Large-flux-ratio linearity measurements on Si photodiodes-Reference-Cited by-同舟云学术

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Large-flux-ratio linearity measurements on Si photodiodes

Published:1982-10-15 Issue:20 Volume:21 Page:3699
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Budde W.

Publisher

The Optical Society

Reference5 articles.

1. Multidecade linearity measurements on Si photodiodes

2. Measurement of dense filters with a Cary 14R spectrophotometer

3. The Calibration of Gloss Reference Standards

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1. Impact of Trap States at Deep Trench Sidewalls on the Responsivity of Island Photodiodes;IEEE Transactions on Electron Devices;2023-11

2. Spectral nonlinearity of an inverse-layer-type silicon photodiode under over-filled illumination;Optics & Laser Technology;2022-09

3. Linearity of a silicon carbide photodiode in the deep-UV spectral region: implications on Doppler broadening thermometry;Metrologia;2020-10-15

4. Photometers and Radiometers;Springer Series in Optical Sciences;2011-11-16

5. Tilted parallel dielectric slab as a multilevel attenuator for incident p- or s-polarized light;Applied Optics;2009-01-09

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