Two-mode interference measurement for nanometer accuracy absolute ranging-Reference-Cited by-同舟云学术

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Two-mode interference measurement for nanometer accuracy absolute ranging

Published:2013-01-17 Issue:3 Volume:38 Page:281
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Phung Duy-Ha,Alexandre Christophe,Lintz Michel

Funder

L’Agence Nationale de la Recherche (ANR)

Centre national d’études spatiales (CNES)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference6 articles.

1. High-accuracy absolute distance measurement using frequency comb referenced multiwavelength source

2. MSTAR: a submicrometer absolute metrology system

3. Rapid and precise absolute distance measurements at long range

4. Many-Wavelength Interferometry with Thousands of Lasers for Absolute Distance Measurement

5. Multiple four-wave mixing in optical fibers: 1.5–3.4-THz femtosecond pulse sources and real-time monitoring of a 20-GHz picosecond source

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1. Research On Absolute Distance Measurement using Inter-mode Beat of Optical Frequency Comb;2022 IEEE 9th International Workshop on Metrology for AeroSpace (MetroAeroSpace);2022-06-27

2. Laser Linewidth Measurement at Fourier Limit Resolution;Laser & Optoelectronics Progress;2019

3. Precise displacement measurement in single-beam interferometry employing photonic metamaterial with effective zero-index;Optics Express;2017-12-04

4. Phase Measurement of a Microwave Optical Modulation: Characterisation and Reduction of Amplitude-to-Phase Conversion in 1.5 μm High Bandwidth Photodiodes;Journal of Lightwave Technology;2014-10

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